Use of patent analytics at different stages of NIOKR readiness to mitigate risks
Abstract
This paper reveals how different aspects of Patent analytics can Be applied at different stages of R&D. It is noted that Patent analytics is good at identifying and mitigating the risks that accompany the research process. Without limiting this, the article draws attention to the Fact that reducing the risks and uncertainty Surrounding an r&d Project is a key aspect of successful research completion.
About the Authors
F. Batanov
FIPS
Russian Federation
Russian Federation
Batanov Fedor, Head of the Project Office of the Federal Institute of Industrial Property
D. Sergejchik
FIPS
Russian Federation
Russian Federation
Sergejchik Dariya, Leading Analyst of the Project Office of the Federal Institute of Industrial Property
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Review
For citations:
Batanov F., Sergejchik D. Use of patent analytics at different stages of NIOKR readiness to mitigate risks. Bulletin of Federal institute of industrial property. 2023;2(3):23-33. (In Russ.)
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